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https://www.rubberinterposer.com/products/ddr-lpddr-flash-test-socket/
DDR/LPDDR/Flash Test Socket
The DDR/LPDDR/Flash Test Socket is specifically designed to accommodate DDR (Double Data Rate), LPDDR (Low Power Double Data Rate), and Flash memory modules for precise testing. Its robust construction and precise engineering ensure reliable contact and signal transmission, facilitating comprehensive testing procedures for memory devices.

DDR/LPDDR/Flash Test Socket Details
Memory Test Rubber Specification
Socket(DDR/LPDDR/Flash/EMMC) Package Type
The optimized solution for memory BGA/LGA etc
Device/PKG Available Pitch
0.25mm-1.27mm

Features of DDR/LPDDR/Flash Test Socket
Low contact force

Durable and consistent contact

Excellent electrical impedance(<100mΩ)

Easy to maintain and replace

Long life span

No ball damage

Features of DDR/LPDDR/Flash Test Socket
Application of DDR/LPDDR/Flash Test Socket
DDR/LPDDR/Flash Test Sockets find applications in various scenarios:

Semiconductor Manufacturing: The DDR/LPDDR/Flash sockets ensure the quality and reliability of DDR, LPDDR, and Flash memory modules before integration into electronic devices.

Product Development: These test sockets and other memory sockets facilitate testing during the design and development phase of electronic products, ensuring compatibility and performance.

Quality Assurance: These memory sockets enable comprehensive testing to verify the functionality, performance, and reliability of memory components in different operating conditions.

Repair and Maintenance: The DDR/LPDDR/Flash sockets support troubleshooting and diagnosis of faulty memory modules in electronic devices, allowing for efficient repair and maintenance processes.

Research and Development: These memory sockets provide researchers and engineers with a tool for evaluating the performance of new memory technologies and optimizing their designs.

Application of DDR/LPDDR/Flash Test Socket
DDR/LPDDR/Flash Test Socket Advancements and Innovations
Enhanced Compatibility: Memory Sockets are designed to accommodate the latest DDR, LPDDR, and Flash memory modules, ensuring compatibility with the newest technologies.

Increased Durability: Utilization of advanced materials and construction techniques to enhance the durability and lifespan of memory test sockets, allowing for prolonged use in testing environments.

Higher Throughput: Introduction of high-speed interfaces and improved contact designs to support higher data rates, enabling faster testing of memory modules without compromising accuracy.